December 8, 2005. Las Vegas. Attendees at the Hong Kong January International Jewellery and Watch Show will have the opportunity to learn the fundamentals behind the American Gem Society (AGS) new Cut Grading System in a free educational session presented by Peter Yantzer, Executive Director of American Gem Society Laboratories, LLC (AGS Laboratories), on January 16, 2006. "Understanding the New AGS Cut Grading System," will give participants a foundation of how AGS Laboratories graders apply cut grades to diamonds, as well as the particular role of certain elements assessed, such as proportion factors. The event marks AGS Laboratories first-ever presentation in Asia.

"Through this presentation, participants will gain a thorough understanding of the AGS Cut Grade parameters and the metrics that measure them, which will help them have the knowledge they need to identify cuts with the best appearance. Additionally, this knowledge can help retailers increase sales of fine goods," said Yantzer. "Our Cut Grade methodology is an important topic to the Asian market, particularly now, as the demand for AGS Laboratories has increased in the region."

In the new Cut-Grading System, all facets of a diamond are measured in three dimensions rather than two dimensions. The measurements are used by a computer program to trace light rays traveling through a diamond. The ray-tracing program shows the quantity and quality of the light being returned to the viewer. In addition to proportion, symmetry, and polish, AGS Laboratories will also consider brightness, dispersion, leakage, contrast and spread in assigning the final cut grade.

For more information regarding AGS Laboratories products and services, please call (702) 233-6120 or visit the website at www.agslab.com.